Vortragender:
Dr. Aidan Arthur Taylor
Infineon Technologies Austria (Villach)
Zeit:
Freitag, 6.11.2026
Beginn: 09:15 Uhr
TEM at Infineon Villach: Electron microscopy in an industrial environment
Abstract:
The laboratories at FELMI-ZFE in Graz and at Infineon’s Failure Analysis department in Villach share many of the same instruments, including light microscopes, SEMs, FIBs, TEMs and AFMs. The working modes, and the types of problem, in these laboratories are quite different.
I will explain the role of the failure analysis department within Infineon and go into some more detail about how Transmission Electron Microscopy helps us to answer those problems. I will discuss some differences between how materials characterization problems are addressed between academia and the semiconductor industry, and I will highlight some of our specific challenges in the lab at Infineon Villach.
