Skip to main content


Materials Characterisation

Light microscopy and Optical 3-D metrology

Surface characterisation with SEM &  AFM

Scanning Electron Microscopy (SEM)
Atomic Force Microscopy (AFM)

Microanalysis using SEM and X-ray spectrometry

 X-ray spectrometry (EDX & WDX)
Scanning Electron Microscopy (SEM)

Materials analysis with HR-TEM

High resolution transmission electron microscopy (HR-TEM)


Elemental nanoanalysis with EELS and EFTEM

Electron energy loss spectroscopy (EELS)
Energy-filtering TEM (EFTEM)

Atomic resolution analysis of materials with the ASTEM

Austrian Scanning Transmission Electron (ASTEM)

Cryo-TEM for soft matter and biomaterials characterisation

Nanostructuring of materials and surfaces with FIB lab

Focused-ion beam (FIB)

In situ microscopy studies of dynamical processes in the ESEM

Environmental SEM (ESEM)

Chemical imaging with FT-infrared and Raman microscopy

Advanced 3-D micro- and nanotomography of devices and materials

Structure and crystallography of materials with XRD, EBSD, SAED and CBED

X-ray diffraction (XRD)
Electron backscattered diffraction (EBSD)
Electron diffraction (SAED and CBED)

State-of-the-art Specimen Preparation

Grind Preparation



Focused-Ion Beam (FIB) 

Nano Mill 

PIPS II  Ion-milling

TEM Grids

Surface Preparation