The Zeiss Sigma 300 VP represents the latest development in GEMINI® technology and comprises a fully integrated inlens detector (Inlens) for secondary electrons (SE) and an angle selective backscattered electron (HDAsB) detector.
The Sigma 300 VP offers ultra high resolution for both SE to image surface information and BSE to present compositional information in the high vacuum mode.
The Ultra 55 represents the latest development in GEMINI® technology and comprises a fully integrated energy and angle selective backscattered electron (EsB) detector.
The Ultra 55 offers ultra high resolution for both secondary electrons (SE) to image surface information and backscattered electrons (BSE) to present compositional information.
The EsB detector features an integrated filtering grid to enhance image quality and requires no additional adjustments.
The FEI ESEM Quanta 600 FEG is a versatile scanning electron microscope with three imaging modes.
The “high vaccum mode” (HV) is a conventional SEM mode with the need of conventional specimen preparation.
In the “low vacuum mode” (LV) electrically non conductive samples can be imaged without the need of a conductive layer (e.g. carbon, gold etc.).
Additionally in the “ESEM mode” (ESEM) wet samples can be investigated in their “natural” state.
The FEI ESEM Quanta 450 FEG is a versatile scanning electron microscope with three imaging modes.
Additionally it is equipped with an SDD detector for energy dispersive X-ray spectroscopy (EDX).
The Gemini DSM 982 was manufactured by LEO Oberkochen (Germany) and is a very versatile scanning electron microscope enabling high resolution imaging (secondary electrons: SE, backscattered electrons: BSE) of surfaces of a great variety of materials.
Although Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) provides highly complementary information, there were no deeply integrated systems available on the market for a very long time.
