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FEI Tecnai F20

This microscope is equipped with a monochromated FEG in combination with a Quantum energy filter and is the high end instrument of the institute at the moment. Besides classical methods (bright field and dark field imaging, selected area and convergent beam diffraction) various analytical methods (EDXS, EFTEM and EELS) as well as tomography are applied at both high spatial and high energy resolution. Furthermore, the microscope can be used in scanning transmission mode (STEM) supported by a novel digiscan unit allowing for high-speed spectrum imaging.
The microscope is used for academic and commercial research – wherever high resolution is needed – as well as for product improvement and development. The high energy resolution enables the investigation and visualization of different chemical bonds or features in the low loss region such as energy gaps and plasmons.
The investigated specimens and materials are diverse as well: steels, ceramics, alloys, biological samples, inorganic and organic semiconductors, devices, polymers, nano particles and many more.

Key Features

  • Field emission gun with a monochromator
  • EDAX Saphire Si(Li) detector
  • Gatan GIF Quantum with DualEELS and High-Speed Spectrum Imaging
  • Gatan UltraScan CCD

Essential Specifications

Maximum Accelerating Voltage:  200 kV
Electron source: Schottky Field Emitter, Monochromator
Energy resolution EELS: 0.1 eV
TEM magnification: 25 x – 2000000 x
TEM point resolution: 0.24 nm
TEM line resolution: 0.10 nm
STEM: Digiscan II with BF, ADF, HAADF
STEM magnification: 100 x – 5M x
Characteristics: 100 x – 10000 kx