X-ray diffraction is widely used for crystallographic analysis to identify powders, thin films and crystals (e.g. minerals, inorganic compounds). Incident X-rays, in our case produced by a copper source, are diffracted into many specific directions when hitting the material. By measuring the angles and intensities of these diffracted beams, we are able to deduce the crystal structure, chemical bonding and various other information.
Siemens D5005
Applications
- Phase identification
- Thin-film analysis
- Purity/quality control of materials
- Determination of crystallinity of polycrystalline materials
- In situ heating experiments (e.g. phasetransformation in dependence of temperature)
Accessories
Heating stage HTK 1200 from Anton Paar ( <1200°C at area or nitrogen atmosphere or Vacuumcondition (10-3mbar))
Specifications
Samples can be analysed in solid, powder, thin film and solution form.
