Scanning Electron Microscopy (SEM)
Atomic Force Microscopy (AFM)
Methods
Materials Characterisation
Light microscopy and Optical 3-D metrology
Surface characterisation with SEM & AFM
Microanalysis using SEM and X-ray spectrometry
X-ray spectrometry (EDX & WDX)
Scanning Electron Microscopy (SEM)
Materials analysis with HR-TEM
High resolution transmission electron microscopy (HR-TEM)
Elemental nanoanalysis with EELS and EFTEM
Electron energy loss spectroscopy (EELS)
Energy-filtering TEM (EFTEM)
Atomic resolution analysis of materials with the ASTEM
Austrian Scanning Transmission Electron (ASTEM)
Cryo-TEM for soft matter and biomaterials characterisation
Nanostructuring of materials and surfaces with FIB lab
Focused-ion beam (FIB)
In situ microscopy studies of dynamical processes in the ESEM
Environmental SEM (ESEM)
Chemical imaging with FT-infrared and Raman microscopy
Advanced 3-D micro- and nanotomography of devices and materials
Structure and crystallography of materials with XRD, EBSD, SAED and CBED
X-ray diffraction (XRD)
Electron backscattered diffraction (EBSD)
Electron diffraction (SAED and CBED)
