Thermo Scientific Hypulse, a revolutionary step forward in XPS depth profiling
Dr. Michael Mannsberger, MBA
Sr. Sales Manager EMEA, Surface Analysis
Thermo Fisher Scientific
Friday, October 17th, 09:15 a.m.
Institute of Electron Microscopy, Seminar Room (3rd floor)
Steyrergasse 17, 8010 Graz

“The Thermo Scientific Hypulse Surface Analysis System is a fully-automated X-ray photoelectron spectroscopy (XPS) instrument that integrates femtosecond laser ablation with traditional ion beam profiling methods to deliver unique insights for the analysis of thin films, interfaces, coatings, and buried layers. While incorporating well proven complementary techniques like ISS and REELS, extending the information available from the material being studied, its pioneering approach offers the possibility of faster, deeper, more precise depth profiling. Furthermore it supports our CISA (Correlative Imaging and Surface Analysis) workflow, where customers can seamlessly merge datasets from our XPS and SEM instruments.”
