Preliminary Programme
1st Day: Scanning Electron Microscopy
Morning
Basic (E)SEM (lecture): electron guns – lenses electron-specimen interaction, signals SEM-imaging (lecture): secondary and backscattered electrons – detectors contrast formation (topographic and material)
Afternoon
Image recording (lab): working distance, focus, astigmatism contamination, damage
2nd Day: X-ray Spectrometry
Morning
Specimen preparation (lecture)
Basic X-ray spectrometry (lecture): information depth, inelastic scattering, applications X-ray Analysis (lecture): detectors (wavelength – energy dispersive), artefacts qualitative – quantitative analysis – mapping
Afternoon
X-ray acquisition (lab): beam energy, count rate, acquisition time spectra – mapping acquisition
3rd Day: Applications
Morning
Analysis of specimens from the participants (lab)
Afternoon
Additional methods by scanning electron microscopy (lecture): EBSD, Variable pressure SEM, Dual beam (SEM-FIB) Alternative Analytical methods (lecture): Transmission electron microscopy Vibrational spectroscopy
