Vortragender:
Andreas Nowak
Advanced Workflow Specialist
Leica Microsystems
Zeit:
Freitag, 12.12.2025
Beginn: 10:00 Uhr
Titel:
Advanced electron microscopy sample preparation techniques for material, – and life science applications. Including a short company history.
Abstract:
Achieving high-quality results in advanced electron microscopy—whether using TEM, SEM, or FIB columns—depends critically on appropriate sample preparation. Today, a broad spectrum of preparation techniques is available, ranging from room temperature methods to cryo applications. This presentation will explore key strategies and workflows tailored to both life science and material science samples, highlighting practical examples and considerations for selecting the most suitable approach. Attendees will gain insights into how optimized preparation enhances imaging outcomes and supports cutting-edge research.