FELMI Seminar Talk: Friday, October 17th, 09:15 a.m.

“The Thermo Scientific Hypulse Surface Analysis System is a fully-automated X-ray photoelectron spectroscopy (XPS) instrument that integrates femtosecond laser ablation with traditional ion beam profiling methods to deliver unique insights for the analysis of thin films, interfaces, coatings, and buried layers. While incorporating well proven complementary techniques like ISS and REELS, extending the information available from the material being studied, its pioneering approach offers the possibility of faster, deeper, more precise depth profiling. Furthermore it supports our CISA (Correlative Imaging and Surface Analysis) workflow, where customers can seamlessly merge datasets from our XPS and SEM instruments.”